Secure Transmission for Nano-Memories using Fault Secure Encoder and Decoder

Harikiran Nallagopula; Tirmalarao

Traditionally, memory cells were the only circuitry susceptible to transient faults. The supporting circuitries around the memory were assumed to be fault-free. Due to the increase in soft error rate in logic circuits, the encoder and decoder circuitry around the memory blocks have become susceptible to soft errors as well and must be protected. Memory cells have been protected from soft errors for more than a decade; due to the increase in soft error rate in logic circuits, the encoder and decoder circuitry around the memory blocks have become susceptible to soft errors as well and must also be protected. Memory cells have been protected from soft errors for more than a decade; due to the increase in soft error rate in logic circuits, the encoder and decoder circuitry around the memory blocks have become susceptible to soft errors as well and must also be protected. Here introducing a new approach to design fault secure encoder and decoder circuitry for memory designs. The key novel contribution of this paper is identifying and defining a new class of error-correcting codes whose redundancy makes the design of fault-secure detectors (FSD) particularly simple and further quantify the importance of protecting encoder and decoder circuitry against transient errors.

Select Volume / Issues:

• Volume 3 Issue 2, Mar. 2012

Year:

2012

Type of Publication:

Article

Keywords:

Secure Transmission; Nano-Memories; Encoder; Corrector; Décor

Journal:

IJECCE

Volume:

3

Number:

2

Pages:

360-362

Month:

March