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"Submissions Open For Vol. 15,Issue 2, Mar. - Apr. 2024"
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Volume 15,Issue 1, Jan. - Feb. 2024
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Secure Transmission for Nano-Memories using Fault Secure Encoder and Decoder
Harikiran Nallagopula; Tirmalarao
Traditionally, memory cells were the only
circuitry susceptible to transient faults. The supporting
circuitries around the memory were assumed to be
fault-free. Due to the increase in soft error rate in logic
circuits, the encoder and decoder circuitry around the
memory blocks have become susceptible to soft errors
as well and must be protected. Memory cells have been
protected from soft errors for more than a decade; due
to the increase in soft error rate in logic circuits, the
encoder and decoder circuitry around the memory
blocks have become susceptible to soft errors as well
and must also be protected. Memory cells have been
protected from soft errors for more than a decade; due
to the increase in soft error rate in logic circuits, the
encoder and decoder circuitry around the memory
blocks have become susceptible to soft errors as well
and must also be protected. Here introducing a new
approach to design fault secure encoder and decoder
circuitry for memory designs. The key novel
contribution of this paper is identifying and defining a
new class of error-correcting codes whose redundancy
makes the design of fault-secure detectors (FSD)
particularly simple and further quantify the
importance of protecting encoder and decoder
circuitry against transient errors.