Fault Tree Model for Assessing the Failure Rate of a Locally Developed and Fabricated Dark Detector

Ehiagwina Ojiemhende Frederick; Afolabi Lateef Olashile; Kehinde Olufemi Oluseye

In other to mitigate the short comings of mechanical switches, solid state switches such as the dark detectors are preferred. The aim of this paper is to develop a model for assessing the reliability of a designed and implemented dark detector switch using fault tree analysis. A model was developed for evaluating or assessing the failure rate of the locally developed and constructed dark detector. The paper also did a review of Fault tree analysis as a reliability prediction tool. For a low resistance value of the LDR due to illumination, the voltage to the non-inverting input becomes 6V, thereby causing the transistor to saturates, that is turned ON and the connected relay is energised. MIL-HDBK-217F and statistical survey or analysis may be used to estimate the probability of failure of each component of the circuit

Select Volume / Issues:

• Volume 6,Issue 6, Nov. 2015

Year:

2015

Type of Publication:

Article

Keywords:

Dark Detector; Fault Tree Analysis; Light Dependent Resistor; Reliability

Journal:

IJECCE

Volume:

6

Number:

6

Pages:

628-633

Month:

November