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A Review of 65-Nm CMOS Constant Current Source with Reduced PVT Variation

Sunil Singh; Sandeep Nemade
Variations in process, supply voltage and temperature (PVT) have always been an issue in Integrated Circuit (IC) Design. In digital circuits, PVT fluctuations affect the switching speed of the transistors and thus the timing of the logic. This paper presents a method to compensate CMOS process-, voltage-, and temperature (PVT) variations. The circuit architecture is based on the embodiment of a process-tolerant bias current circuit and a scaled process-tracking bias voltage source for the dedicated temperature-compensated voltage to- current conversion in a pre-regulator loop
Select Volume / Issues:
Year:
2017
Type of Publication:
Article
Keywords:
Current Reference; Line Sensitivity; Process Tracking; Temperature Compensation; Threshold Voltage VTH Circuit
Journal:
IJECCE
Volume:
8
Number:
6
Pages:
329-331
Month:
November
ISSN:
2249-071X
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